JPH0412469Y2 - - Google Patents

Info

Publication number
JPH0412469Y2
JPH0412469Y2 JP1981039916U JP3991681U JPH0412469Y2 JP H0412469 Y2 JPH0412469 Y2 JP H0412469Y2 JP 1981039916 U JP1981039916 U JP 1981039916U JP 3991681 U JP3991681 U JP 3991681U JP H0412469 Y2 JPH0412469 Y2 JP H0412469Y2
Authority
JP
Japan
Prior art keywords
holding member
contact holding
temperature
heat plate
guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981039916U
Other languages
English (en)
Japanese (ja)
Other versions
JPS57153273U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981039916U priority Critical patent/JPH0412469Y2/ja
Publication of JPS57153273U publication Critical patent/JPS57153273U/ja
Application granted granted Critical
Publication of JPH0412469Y2 publication Critical patent/JPH0412469Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1981039916U 1981-03-20 1981-03-20 Expired JPH0412469Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981039916U JPH0412469Y2 (en]) 1981-03-20 1981-03-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981039916U JPH0412469Y2 (en]) 1981-03-20 1981-03-20

Publications (2)

Publication Number Publication Date
JPS57153273U JPS57153273U (en]) 1982-09-25
JPH0412469Y2 true JPH0412469Y2 (en]) 1992-03-25

Family

ID=29837033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981039916U Expired JPH0412469Y2 (en]) 1981-03-20 1981-03-20

Country Status (1)

Country Link
JP (1) JPH0412469Y2 (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009097968A (ja) * 2007-10-16 2009-05-07 Akim Kk 温度特性計測装置および温度特性計測方法
JP2018004449A (ja) * 2016-07-01 2018-01-11 三菱電機株式会社 測定装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5536394Y2 (en]) * 1973-06-04 1980-08-27
JPS5521158A (en) * 1978-08-01 1980-02-15 Nec Corp Checking method for semiconductor device

Also Published As

Publication number Publication date
JPS57153273U (en]) 1982-09-25

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